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    基于CSAT-ICVDA的数据缺失情况下的工业过程故障监测

    Fault Monitoring of Industrial Processes with Data Missing Based on Sparse Transformer and Integrated CVDA

    • 摘要: 针对工业过程数据缺失破坏变量相关结构与时序依赖关系,进而降低早期故障监测性能的问题,本文提出一种面向数据缺失条件下工业过程早期故障监测的CSAT-ICVDA方法。首先,构建卷积稀疏注意力Transformer(Convolutional Sparse Attention Transformer,CSAT)数据插补模型,在传统Transformer基础上融合卷积特征增强与Top-k稀疏注意力机制,实现局部动态特征和关键时序依赖关系的协同建模,并结合改进掩码机制与插补–重构双阶段结构提升缺失数据恢复能力。其次,引入集成学习思想构建改进典型变量差异分析(ICVDA)模型,通过融合多个CVDA检测器并利用奇异值特征构造监测指标,提高对早期微弱故障的检测灵敏度与稳定性。最后,以青霉素发酵过程和大肠杆菌发酵过程开展实验验证。结果表明,所提出的CSAT-ICVDA方法能够在数据缺失条件下有效恢复过程特征,并实现工业过程早期故障的准确监测,具有较高的故障检测率和工程应用潜力。

       

      Abstract: To address the problem that missing data in industrial processes disrupts variable correlation structures and temporal dependencies, thereby degrading early fault monitoring performance, this paper proposes a CSAT-ICVDA method for early fault monitoring of industrial processes under missing-data conditions. First, a Convolutional Sparse Attention Transformer (CSAT) data imputation model is constructed. Based on the traditional Transformer architecture, convolutional feature enhancement and Top-k sparse attention mechanisms are integrated to achieve collaborative modeling of local dynamic features and key temporal dependencies. Meanwhile, an improved masking mechanism and a two-stage imputation–reconstruction structure are introduced to enhance missing data recovery capability. Second, an improved canonical variate dissimilarity analysis (ICVDA) model is developed by incorporating ensemble learning. Multiple CVDA detectors are fused, and singular value features are used to construct a new monitoring index, thereby improving the detection sensitivity and stability for incipient faults. Finally, experiments are conducted on penicillin fermentation and Escherichia coli fermentation processes. The results demonstrate that the proposed CSAT-ICVDA method can effectively recover process features under missing-data conditions and accurately monitor early faults in industrial processes, showing a high fault detection rate and promising engineering applicability.

       

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